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Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...

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Related Experiment Video

Updated: Jun 30, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

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Published on: August 25, 2016

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High-energy micrometre-scale pixel direct conversion X-ray detector.

Christopher C Scott1, Michael Farrier2, Yunzhe Li1

  • 1KA Imaging Inc., 560 Parkside Drive, Unit 3, Waterloo, Ontario, Canada N2L 5Z4.

Journal of Synchrotron Radiation
|July 2, 2021
PubMed
Summary

This study presents a new X-ray imaging detector with micrometer pixels and high efficiency for hard X-rays. The amorphous selenium/CMOS technology offers advanced capabilities for synchrotron imaging applications.

Keywords:
amorphous seleniumhigh-energy X-ray detectormicrometre-scale spatial resolution

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Area of Science:

  • Medical Imaging
  • Materials Science
  • Physics

Background:

  • Current X-ray detectors have limitations for high-energy synchrotron applications.
  • Need for detectors with micrometer-scale pixel dimensions and high efficiency above 20 keV.

Purpose of the Study:

  • To fabricate and characterize a novel X-ray imaging detector.
  • To achieve micrometer-scale pixel dimensions and high detection efficiency for hard X-rays (>20 keV).

Main Methods:

  • Fabrication of a monolithic hybrid detector using amorphous selenium deposited on a custom CMOS readout integrated circuit.
  • Characterization at the Advanced Photon Source synchrotron beamline 1-BM-B.
  • Performance evaluation including spatial resolution, linearity, responsivity, and lag.

Main Results:

  • Demonstrated micrometer-scale spatial resolution (8 µm) and 10% modulation transfer function at Nyquist frequency for 63 keV X-rays.
  • Achieved high detection efficiency for hard X-ray energies above 20 keV.
  • Observed phase contrast edge enhancement, indicating potential for advanced imaging techniques.

Conclusions:

  • The amorphous selenium/CMOS detector technology addresses limitations of current detectors for synchrotron applications (>50 keV).
  • Enables advanced techniques like phase contrast tomography and high-resolution imaging of nanoscale lattice distortions.
  • Facilitates novel synchrotron imaging applications at X-ray energies at or above 20 keV.