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X-ray Crystallography02:18

X-ray Crystallography

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
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Related Experiment Video

Updated: Oct 30, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Quantitative order-parameter measurement in lattice-mismatched AlInP using precession electron diffraction.

Xavier Pasala1, Nikhil Pokharel1, Phil Ahrenkiel1

  • 1Nanoscience & Nanoengineering, South Dakota School of Mines & Technology, 501 E. Saint Joseph St., Rapid City, South Dakota, 57701, U.S.A.

Journal of Microscopy
|July 5, 2021
PubMed
Summary
This summary is machine-generated.

Precession electron diffraction measured long-range order in AlInP films for solid-state lighting. A maximum order parameter of S = 0.36 was found in double-variant films grown at 650 °C.

Keywords:
atomic orderinglight-emitting diodesprecession electron diffractionsemiconductorssolid-state lightingtransmission electron microscopy

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Area of Science:

  • Materials Science
  • Solid-State Physics
  • Optoelectronics

Background:

  • AlInP epitaxial films are crucial for advanced solid-state lighting.
  • Controlling long-range order is key to optimizing film properties.
  • Lattice mismatch in AlInP presents challenges for ordered structures.

Purpose of the Study:

  • To quantify the long-range order parameter in lattice-mismatched AlInP films.
  • To investigate the effect of growth temperature on ordering.
  • To correlate structural order with potential lighting applications.

Main Methods:

  • Precession electron diffraction (PED) was employed for precise structural analysis.
  • Transmission Electron Microscopy (TEM) in cross-section enabled detailed imaging.
  • Dynamical diffraction simulations were used to interpret experimental PED data.

Main Results:

  • The long-range order parameter (S) was successfully measured in AlInP films.
  • Maximum order parameter (S = 0.36) observed in double-variant films at 650 °C.
  • Atomic displacements of anions showed a near-linear dependence on the order parameter.

Conclusions:

  • PED is an effective technique for characterizing order in AlInP epitaxial films.
  • Growth temperature significantly influences the degree of long-range order.
  • Understanding ordering is vital for developing high-performance solid-state lighting devices.