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Spatially resolved single-shot absorption spectroscopy with x-ray free electron laser pulse
Yuichi Inubushi1, Toshinori Yabuuchi1, Kohei Miyanishi2
1Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.
The Review of Scientific Instruments
|July 10, 2021
Summary
A new spatially resolved spectroscopy method for X-ray Free Electron Laser (XFEL) pulses was developed. This technique successfully observed spectral changes in laser-generated plasma, enabling advanced high energy density science research.
Area of Science:
- Atomic and Molecular Physics
- Plasma Physics
- Materials Science
Background:
- X-ray Free Electron Lasers (XFELs) provide intense, ultrashort pulses for advanced spectroscopy.
- Achieving high spatial resolution in single-shot XFEL absorption spectroscopy remains a challenge.
- Understanding transient states in laser-induced plasmas requires precise spectroscopic measurements.
Purpose of the Study:
- To develop a novel method for spatially resolved single-shot absorption spectroscopy using XFEL pulses.
- To enhance spatial resolution in XFEL-based absorption spectroscopy.
- To demonstrate the capability of observing spectral changes in laser-generated plasmas.
Main Methods:
- Utilized a dispersive spectrometer combined with an elliptical mirror for enhanced spatial resolution.
- Employed a pump-probe scheme with an XFEL pulse and a high-power femtosecond laser.
- Performed X-ray absorption near-edge structure (XANES) measurements on Copper (Cu).
Main Results:
- Successfully developed and demonstrated a spatially resolved single-shot absorption spectroscopy technique.
- Observed dynamic changes in the absorption spectrum of laser-generated plasma.
- Achieved enhanced spatial resolution for XFEL pulse measurements.
Conclusions:
- The new method is a powerful tool for experiments demanding high spatial and/or single-shot resolution.
- This technique is particularly suited for high energy density science applications involving high-power laser pulses.
- Enables detailed investigation of transient phenomena in plasmas and materials.
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