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Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
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Erratum: "Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric
Khaled Kaja1, Denis Mariolle2, Nicolas Chevalier2
1Laboratoire National de Métrologie et d'Essais, 29 Rue Roger Hennequin, 78190 Trappes, France.
The Review of Scientific Instruments
|July 10, 2021
Abstract
No abstract available in PubMed .

