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Photography-based real-time long-wave infrared scattering estimation technique.

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    This study introduces a fast method using thermal camera images to measure surface light scattering in the long-wave infrared spectrum. The technique accurately estimates scattering patterns for passive surfaces, offering a quicker alternative to traditional lab measurements.

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    Area of Science:

    • Optics
    • Surface Science
    • Infrared Technology

    Background:

    • Accurate characterization of surface light scattering is crucial for various applications.
    • Traditional bidirectional reflectance distribution function (BRDF) measurements are time-consuming.
    • Long-wave infrared (LWIR) surface properties are important for thermal imaging and remote sensing.

    Purpose of the Study:

    • To develop and validate a rapid method for measuring surface scattered light distribution in the LWIR spectrum.
    • To assess the applicability of the method for passive, homogeneous surfaces.
    • To compare the results with traditional goniometer-based measurements.

    Main Methods:

    • Utilizing a small set of thermal camera images (six images) captured at varying angles (10°–60°) relative to a thermal light source.
    • Employing deconvolution techniques to extract scattering patterns from the image data, accounting for the light source's shape.
    • Testing the method on both highly specular (black Masonite) and diffuse (painted drywall) surfaces.

    Main Results:

    • The proposed method successfully estimates scattering patterns for tested surfaces.
    • The technique demonstrates significantly faster data acquisition compared to standard BRDF measurements.
    • Achieved errors of ≤3% when comparing estimated scattering distributions to goniometer-based measurements, with limitations for extremely specular surfaces due to speckle noise.

    Conclusions:

    • Thermal imaging offers an efficient approach for characterizing LWIR surface scattering.
    • This method is suitable for homogeneous passive surfaces, providing a valuable alternative for rapid analysis.
    • Further investigation may be needed to address challenges with highly specular surfaces and speckle noise.