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Updated: Oct 27, 2025

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
Published on: July 24, 2015
High-reliability graphene-wrapped nanoprobes for scanning probe microscopy
Liang Cao1,2, Ri Liu1,2, Wenxiao Zhang1,2
1International Research Centre for Nano Handling and Manufacturing of China, Changchun University of Science and Technology, Changchun 130022, People's Republic of China.
Abstract:
The nanoprobe is a powerful tool in scanning probe microscopy (SPM) that is used to explore various fields of nanoscience. However, the tips can wear out very fast due to the low stability of conventional probes, especially after the measurement of high currents or lateral friction, which results in image distortion and test imprecision. Herein, a novel functional nanoprobe is presented using graphene sheets in a high-quality graphene solution wrapped round a plasma-treated conventional Pt-Ir coated nanoprobe, which shows highly stability and resistance to degradation, leading to a significantly increased lifetime. Furthermore, we show that the graphene-wrapped nanoprobes have the advantages of enhanced electrical conductivity and reduced tip-sample friction, compared with Pt-Ir coated nanoprobes. The simplicity and low cost of this method make it valuable to various functional graphene-wrapped nanoprobes and applications.
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