Related Experiment Video
Updated: Oct 25, 2025

A Dual Task Procedure Combined with Rapid Serial Visual Presentation to Test Attentional Blink for Nontargets
Published on: December 5, 2014
Transparent Memory Tests Based on the Double Address Sequences
Ireneusz Mrozek1, Vyacheslav N Yarmolik2
1Faculty of Computer Science, Bialystok University of Technology, 15-351 Białystok, Poland.
Abstract:
An important achievement in the functional diagnostics of memory devices is the development and application of so-called transparent testing methods. This is especially important for modern computer systems, such as embedded systems, systems and networks on chips, on-board computer applications, network servers, and automated control systems that require periodic testing of their components. This article analyzes the effectiveness of existing transparent tests based on the use of the properties of data stored in the memory, such as changing data and their symmetry. As a new approach for constructing transparent tests, we propose to use modified address sequences with duplicate addresses to reduce the time complexity of tests and increase their diagnostic abilities.
Related Concept Videos
Understanding Memory
System of Memory
Maxam-Gilbert Sequencing
Challenges of the Maxam-Gilbert Method
The...
Wald-Wolfowitz Runs Test II
For binary data, runs are identified using symbols such as + and −, or equivalently, 1s and...
Next-generation Sequencing
Next-Generation Sequencing Methods
Although all next-generation methods use different technologies, they all share a set of standard features....
Woodward–Hoffmann Selection Rules and Microscopic Reversibility

