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Preparation of Samples for Electron Microscopy01:20

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To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
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Updated: Oct 24, 2025

A Method for Obtaining Serial Ultrathin Sections of Microorganisms in Transmission Electron Microscopy
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Sample preparation for analytical scanning electron microscopy using initial notch sectioning.

Richard Busch1, Christopher Tielemann2, Stefan Reinsch2

  • 1Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Walter-Hülse-Straße 1, 06120 Halle (Saale), Germany.

Micron (Oxford, England : 1993)
|August 13, 2021
PubMed
Summary
This summary is machine-generated.

A new sample sectioning method uses initial notches and ion beam erosion to create depth-profiled terraces. This technique enhances material analysis by providing access to depth-dependent microstructures for both conducting and non-conducting samples.

Keywords:
Analytical scanning electron microscopyEBSDIon beam erosionSEMSample preparationSectioning

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Surface Science

Background:

  • Traditional sample preparation methods can be time-consuming and may not provide adequate depth-dependent microstructural information.
  • Accessing subsurface microstructures is crucial for understanding material properties and performance.

Purpose of the Study:

  • To introduce a novel broad ion beam sectioning method utilizing initial notches for creating depth-profiled terraces.
  • To demonstrate the applicability of this method for both conducting and non-conducting materials.
  • To investigate the influence of experimental parameters on the success of sample preparation.

Main Methods:

  • Utilizing an adapted sample geometry with initial notches.
  • Employing broad ion beam erosion at glancing angles.
  • Analyzing the resulting terraces using analytical scanning electron microscopy and electron backscatter diffraction.

Main Results:

  • The novel method successfully creates well-defined terraces with controlled step erosion depths.
  • The technique is effective for both conducting and non-conducting specimens.
  • Key experimental parameters influencing preparation success were identified.

Conclusions:

  • The presented notch-based ion beam sectioning method offers an efficient approach for depth-dependent microstructural analysis.
  • This technique facilitates detailed studies of phenomena like orientation-dependent crystal growth.
  • The method is versatile and applicable across a range of material types.