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Trapped Electrons and Ions as Particle Detectors.

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Summary
This summary is machine-generated.

Trapped charged particles in electromagnetic fields can detect low-energy particles and dark matter. These quantum systems offer high sensitivity for particle physics and quantum computing noise characterization.

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Area of Science:

  • Atomic, Molecular, and Optical Physics
  • Quantum Information Science
  • Particle Physics

Background:

  • Electromagnetic field-trapped ions and electrons are established metrological tools.
  • These systems are emerging as platforms for quantum information processing.
  • Their extreme charge-to-mass ratio and quantum control offer unique sensing capabilities.

Purpose of the Study:

  • To highlight the potential of trapped charged particle systems as highly sensitive detectors for charged particles.
  • To explore applications in particle physics, including dark matter detection.
  • To assess their utility in characterizing quantum computer noise.

Main Methods:

  • Theoretical analysis of energy deposition detection below ionization scales.
  • Proposal of a nondestructive time-of-flight measurement for sub-eV energy resolution.
  • Calculation of sensitivity to dark matter models with millicharged particles.

Main Results:

  • Demonstrated potential for detecting energy depositions orders of magnitude below typical ionization thresholds.
  • Outlined a nondestructive time-of-flight technique with sub-eV energy resolution.
  • Showcased competitive sensitivity for detecting millicharged dark matter particles.

Conclusions:

  • Trapped charged particle systems present a novel, highly sensitive detection method for various applications.
  • These systems can advance particle physics research and aid in quantum computing diagnostics.
  • Further exploration of their sensing capabilities is warranted.