Atomic Force Microscopy
Super-resolution Fluorescence Microscopy
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Updated: Oct 23, 2025

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
Published on: October 24, 2014
Byullee Park1, Seunghyun Lee1, Jimin Kwon1
1Departments of Electrical Engineering, Medical Device Innovation Center, Convergence IT Engineering, Mechanical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, 37673, Republic of Korea.
Dual-pulse photoactivated atomic force microscopy (DP-pAFM) enhances nanoscale imaging by using two laser pulses. This novel method maps optical structures and visualizes critical nanoscale cracks in semiconductors without damaging the sample.
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