Research on Decomposition of Offset in MEMS Capacitive Accelerometer.

Xianshan Dong1, Yun Huang1, Ping Lai1

  • 1Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, No. 5 Electronics Research Institute of the Ministry of Industry and Information Technology, Guangzhou 510610, China.

Micromachines
|August 27, 2021
PubMed
Summary

Offset in micro-electro-mechanical systems (MEMS) capacitive accelerometers degrades performance. A novel decomposition method successfully identified fabricated gap mismatch as the primary offset source, guiding future MEMS accelerometer improvements.

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