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Published on: August 15, 2014
Research on Decomposition of Offset in MEMS Capacitive Accelerometer.
Xianshan Dong1, Yun Huang1, Ping Lai1
1Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, No. 5 Electronics Research Institute of the Ministry of Industry and Information Technology, Guangzhou 510610, China.
Offset in micro-electro-mechanical systems (MEMS) capacitive accelerometers degrades performance. A novel decomposition method successfully identified fabricated gap mismatch as the primary offset source, guiding future MEMS accelerometer improvements.
Area of Science:
- Electrical Engineering
- Mechanical Engineering
- Materials Science
Background:
- Offset in micro-electro-mechanical systems (MEMS) capacitive accelerometers arises from complex mechanical and electrical factors.
- This offset significantly deteriorates accelerometer performance, necessitating effective reduction strategies.
Purpose of the Study:
- To propose and validate a novel decomposition method for analyzing offset in MEMS capacitive accelerometers.
- To quantitatively analyze offset compositions and identify key contributing parameters.
Main Methods:
- Developed a quantitative analysis framework for MEMS accelerometer offset.
- Established methods for measuring critical offset-related parameters.
- Applied the decomposition method to a closed-loop MEMS capacitive accelerometer experiment.
Main Results:
- Successfully decomposed the offset in the MEMS capacitive accelerometer.
- Identified fabricated gap mismatch in the MEMS sensor as the major source of offset.
- Demonstrated the efficacy of the proposed decomposition technique.
Conclusions:
- The proposed offset decomposition method offers a new approach for analyzing MEMS capacitive accelerometers.
- Understanding the major offset source (gap mismatch) enables targeted improvements.
- This work facilitates purposeful steps to reduce offset and enhance accelerometer performance.
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