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A Finite-Difference Approach for Plasma Microwave Imaging Profilometry.
Loreto Di Donato1,2, David Mascali2, Andrea F Morabito3
1Department of Electrical, Electronics and Computer Engineering (DIEEI), University of Catania, viale A. Doria 6, 95126 Catania, Italy.
Journal of Imaging
|August 30, 2021
Summary
Microwave imaging profilometry (MIP) offers volumetric plasma diagnostics, overcoming limitations of standard methods. This study presents a finite-difference frequency-domain approach for improved plasma profiling in reactors.
Area of Science:
- Plasma physics and engineering
- Electromagnetics
- Computational physics
Background:
- Plasma diagnostics are crucial for optimizing plasma reactors.
- Microwave techniques like reflectometry, interferometry, and polarimetry are effective.
- Microwave imaging profilometry (MIP) offers potential for volumetric plasma information.
Purpose of the Study:
- To address challenges in microwave imaging profilometry (MIP) for plasma diagnostics.
- To develop a method for obtaining tomographic plasma information.
- To overcome limitations of standard non-invasive diagnostic approaches.
Main Methods:
- Utilizing microwave diagnostics, specifically microwave imaging profilometry (MIP).
- Addressing the non-linear and ill-posed inverse scattering problem inherent in MIP.
- Adopting a finite-difference frequency-domain (FDFD) formulation.
- Approximating magnetically confined plasma as an isotropic and weakly penetrable medium under high-frequency probing.
Main Results:
- The finite-difference frequency-domain (FDFD) formulation effectively handles non-homogeneous backgrounds in plasma reactors.
- The proposed approach addresses the complexities of plasma electromagnetic features dependent on frequency, angle, and polarization.
- The study tackles the challenges of MIP in both large and small reactor environments.
Conclusions:
- The developed FDFD formulation provides a viable method for microwave inverse profiling of plasma.
- This technique enhances the capability of obtaining volumetric plasma data, crucial for reactor development.
- The approach offers a pathway to overcome intrinsic limitations in plasma diagnostics.
Keywords:
electromagnetic inverse scatteringfinite-difference methodsmicrowave imaging profilometrymicrowave plasma diagnostics
