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Related Experiment Video

Updated: Oct 21, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Visualization of Subatomic Movements in Nanostructures.

Tongjun Liu¹, Jun-Yu Ou¹, Eric Plum¹

¹Optoelectronics Research Centre and Centre for Photonic Metamaterials, University of Southampton, Highfield, Southampton SO17 1BJ, U.K.

|September 1, 2021

Summary

This summary is machine-generated.

This study introduces a new motion visualization technique combining electron microscopy

Keywords:

electron microscopy metrology nanomechanics thermal motion

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Area of Science:

Materials Science
Nanotechnology
Physics

Background:

Current imaging techniques lack speed for micro-/nano-object motion.
Optical interferometry offers high sensitivity but limited resolution.
Bridging this gap is crucial for understanding dynamic nanoscale phenomena.

Purpose of the Study:

To develop a novel technique for visualizing high-frequency nanoscale motion.
To combine picometric displacement sensitivity with nanometric spatial resolution.
To enable the study of ultrafast movements in micro-/nano-objects.

Main Methods:

Spectrally resolved detection of secondary electron emission from moving objects.
Integration with electron microscopy for high spatial resolution.
Quantitative validation using nanocantilever Brownian motion.

Main Results:

Achieved picometric displacement sensitivity with nanometric spatial resolution.
Demonstrated visualization of driven modes in cantilevers, metamaterials, and MEMS devices.
Noise floor of ~1 pm/Hz^1/2 enables subatomic amplitude oscillation studies.

Conclusions:

The new technique visualizes fast nanoscale motion with unprecedented resolution and sensitivity.
Opens new avenues for studying dynamic processes in functional materials and devices.
Facilitates interrogation of motion in materials science, bio-, and nanosciences.