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Resolving complex subwavelength grating structures using topologically structured light.

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    Harnessing phase singularities in structured light enhances nanoscale imaging precision. This technique improves resolution for feature sizes down to λ/10.5, surpassing traditional methods.

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    Area of Science:

    • Optics and Photonics
    • Nanotechnology
    • Microscopy

    Background:

    • Phase singularities in structured light offer enhanced measurement precision for nanoscale objects.
    • Exploiting local intensity and phase variations in incident light fields is key to improving resolution.

    Purpose of the Study:

    • To extend the advantages of phase singularities in structured light to imaging applications.
    • To demonstrate improved resolution in nanoscale imaging using superoscillatory illumination.

    Main Methods:

    • Analyzing scattering patterns from binary gratings under superoscillatory illumination.
    • Utilizing single-shot and positionally-displaced few-shot measurements.
    • Comparing resolution achieved with structured light versus plane wave illumination.

    Main Results:

    • Feature sizes down to approximately λ/6.6 were resolved in single-shot measurements.
    • Resolution improved to approximately λ/10.5 in few-shot measurements.
    • Structured light imaging outperformed plane wave illumination, especially in few-shot scenarios.

    Conclusions:

    • Superoscillatory illumination with phase singularities significantly enhances nanoscale imaging resolution.
    • The technique shows promise for resolving subwavelength features beyond the diffraction limit.
    • Interference effects in complex objects can further improve resolution, offering new imaging possibilities.