Characterization of rubidium thin cell properties with sandwiched structure using a multipath interferometer with an...

Area of Science:

• Optics and Photonics
• Materials Science
• Atomic Physics

Background:

• Multilayered structures are crucial for applications like atom-based sensors and optical filters.
• Accurate characterization of thin film properties is essential for device performance.

Purpose of the Study:

• To propose and validate a robust, non-destructive method for characterizing thin multilayered structures.
• To demonstrate the capability of identifying layer number and physical thickness in a three-layered cell.

Main Methods:

• Utilizing a femtosecond optical frequency comb with multipath interferometry.
• Characterizing a borosilicate glass-rubidium-borosilicate glass sandwiched structure.
• Scanning the entire region to obtain a global distribution map.

Main Results:

• Successfully identified the layer number and physical thickness of the three-layered structure.
• Validated the method by confirming sub-Doppler reflection spectra of the rubidium D2 line.
• Generated a global distribution map of the thin cell properties.

Conclusions:

• The proposed multipath interferometry method is effective for non-destructive characterization of thin multilayered cells.
• This technique supports the development of advanced atomic devices and optical components.
• The results highlight strong light-matter interactions at atomic scales.