A Deep Learning-Based Method for Automatic Assessment of Stomatal Index in Wheat Microscopic Images of Leaf Epidermis

Chuancheng Zhu1, Yusong Hu1, Hude Mao2

  • 1School of Computer and Artificial Intelligence, Wuhan University of Technology, Wuhan, China.

Frontiers in Plant Science
|September 20, 2021
PubMed

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