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Related Experiment Video

Updated: Oct 19, 2025

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Prismatic 2.0 - Simulation software for scanning and high resolution transmission electron microscopy (STEM and

Luis Rangel DaCosta1, Hamish G Brown2, Philipp M Pelz1

  • 1National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA, USA; Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA 94720, USA.

Micron (Oxford, England : 1993)
|September 24, 2021
PubMed
Summary

Prismatic 2.0 is a new open-source software for fast scanning transmission electron microscopy (STEM) simulations. It significantly reduces calculation times for atomic-resolution materials science, making STEM experiments easier to interpret.

Keywords:
Electron scatteringOpen sourceScanning transmission electron microscopySimulationTransmission electron microscopy

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Area of Science:

  • Materials Science
  • Computational Physics
  • Electron Microscopy

Background:

  • Scanning transmission electron microscopy (STEM) is crucial for atomic-resolution materials characterization.
  • Accurate simulations are essential for interpreting STEM experimental data.
  • Traditional STEM simulations are computationally intensive due to the need for modeling electron scattering at each probe position.

Purpose of the Study:

  • To introduce Prismatic version 2.0, a significantly improved software for fast STEM simulations.
  • To enhance the efficiency and accessibility of STEM simulations for materials science research.
  • To provide a versatile tool for interpreting complex STEM experimental results.

Main Methods:

  • Developed Prismatic 2.0, featuring algorithmic improvements for faster simulations.
  • Incorporated support for multi-CPU and multi-GPU systems.
  • Included conventional multislice and the PRISM simulation methods.

Main Results:

  • Prismatic 2.0 enables rapid simulation of STEM experiments, drastically reducing calculation times.
  • The software supports advanced features like plane-wave transmission electron microscopy (TEM) and includes a graphical user interface (GUI).
  • New algorithmic improvements and post-processing capabilities enhance simulation accuracy and utility.

Conclusions:

  • Prismatic 2.0 offers a powerful and efficient solution for STEM simulations, accelerating materials characterization.
  • The open-source availability and multi-platform support (C++, Python, Docker) increase accessibility for researchers.
  • This advancement facilitates more accurate interpretation of atomic-resolution STEM data.