Jove
Visualize
Contact Us

Related Concept Videos

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

11.8K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
11.8K
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

6.1K
In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
6.1K
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

6.1K
To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
6.1K
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

4.6K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
4.6K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same journal

Microfluidic-enabled stretchable thermoelectric device array for multimodal haptic interfaces.

Microsystems & nanoengineering·2026
Same journal

Synergistic effects of nicotine and hyperlipidemia induce cardiac damage via dynamic cardiomyocyte-based biosensing.

Microsystems & nanoengineering·2026
Same journal

A novel high-sensitivity triaxial accelerometer based on 3-D phononic crystals.

Microsystems & nanoengineering·2026
Same journal

Laser-induced graphene/Cu-based fully-porous flexible capacitive pressure sensor with ultra-fast response and wide measurement range.

Microsystems & nanoengineering·2026
Same journal

A microfluidic hollow-fiber infection model (µHFIM): monitoring bacterial response to dynamic drug treatment with single-cell resolution.

Microsystems & nanoengineering·2026
Same journal

Intelligent monitoring system for pipeline status based on MEMS acoustic emission sensors.

Microsystems & nanoengineering·2026
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: Oct 19, 2025

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

9.7K

Field-emission electron gun for a MEMS electron microscope.

Michał Krysztof1

  • 1Department of Microsystems, Faculty of Microsystem Electronics and Photonics, Wroclaw University of Science and Technology, ul. Z. Janiszewskiego 11/17, 50-372 Wroclaw, Poland.

Microsystems & Nanoengineering
|September 27, 2021
PubMed
Summary

A novel sharp silicon/carbon nanotube (CNT) cathode was developed for microelectromechanical system (MEMS) electron microscopes. This field-emission electron gun demonstrates stable operation and potential for miniaturized electron microscopy applications.

Keywords:
Electronic devicesSensors

More Related Videos

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

11.2K
Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments
08:31

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments

Published on: June 27, 2022

1.9K

Related Experiment Videos

Last Updated: Oct 19, 2025

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

9.7K
Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

11.2K
Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments
08:31

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments

Published on: June 27, 2022

1.9K

Area of Science:

  • Materials Science
  • Microelectromechanical Systems (MEMS)
  • Electron Optics

Background:

  • Microelectromechanical systems (MEMS) electron microscopes require miniaturized electron sources.
  • Field-emission electron guns are crucial components for generating electron beams.

Purpose of the Study:

  • To develop and characterize a novel field-emission electron gun for MEMS electron microscopes.
  • To evaluate the performance of a sharp silicon/carbon nanotube (CNT) cathode in diode and triode configurations.

Main Methods:

  • Fabrication of a silicon cathode with a sharp protrusion and deposited CNTs.
  • Testing the electron gun in diode and triode configurations under varying voltages.
  • Analysis of emission current, stability, beam spot size, and lifetime.
  • Observation of cathodoluminescence under atmospheric pressure conditions.

Main Results:

  • Low threshold voltage (<1000 V) and high emission current (90 µA) achieved in diode configuration.
  • Stable emission current with low fluctuation (<10% RMS) over extended operation.
  • Electron beam spot size matched the emission area (~10 µm).
  • Gate electrode in triode configuration controlled emission current and improved gun lifetime.
  • Feedback loop reduced anode current fluctuations to ~1%.

Conclusions:

  • The developed sharp silicon/CNT cathode is a viable electron source for MEMS electron microscopes.
  • The electron gun demonstrates stable and controllable electron emission suitable for miniaturized systems.
  • Successful operation under atmospheric pressure conditions opens possibilities for portable electron microscopy devices.