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Updated: Oct 18, 2025

Spectral Reflectometric Microscopy on Myelinated Axons In Situ
Published on: July 2, 2018
Daniel C Sweeney1, Dennis M Sweeney2, Christian M Petrie1
1Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
Optical backscatter reflectometry (OBR) measurements can now be optimally reconstructed using adaptive algorithms and a maximum spanning tree (MST). This method improves distributed sensing accuracy, even when some locations become unresolvable.
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