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Related Experiment Video

Updated: Oct 18, 2025

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Hard X-ray nanoprobe scanner.

Jumpei Yamada^1,2, Ichiro Inoue¹, Taito Osaka¹

¹RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.

|September 29, 2021

Summary

This summary is machine-generated.

Scientists developed a new nanoprobe scanner for scanning X-ray microscopes (SXMs), overcoming challenges in X-ray beam deflection. This innovation enables single-nanometer accuracy, significantly advancing X-ray microscopy resolution.

Keywords:

X-ray mirrors X-ray nanoprobes X-ray optics X-ray prisms hard X-rays scanning X-ray microscopy

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Area of Science:

Materials Science
Optics
Physics

Background:

X-ray microscopy offers complementary information to optical and electron microscopy.
Deflecting X-ray beams is challenging, hindering the development of high-resolution scanning X-ray microscopes (SXMs).

Purpose of the Study:

To propose a novel and straightforward method for constructing an SXM with a nanoprobe scanner.
To overcome the limitations of X-ray beam deflection for advanced microscopy.

Main Methods:

A nanoprobe scanner combining X-ray prisms and Kirkpatrick-Baez focusing mirrors was developed.
X-ray probe scanning with single-nanometer accuracy was achieved by rotating prisms.
The system's performance was validated using a test pattern at 10 keV.

Main Results:

An SXM image of a test pattern was successfully acquired.
The system resolved 50 nm line-and-space structures, demonstrating its capability.
The proposed method facilitates SXM development with single-nanometer resolution.

Conclusions:

The developed nanoprobe scanner is a simple and effective solution for high-resolution SXM.
This technique is compatible with advanced synchrotron radiation sources.
The innovation paves the way for achieving ultimate resolution in X-ray microscopy.