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Research on Total Ionizing Dose Effect and Reinforcement of SOI-TFET

Chen Chong1, Hongxia Liu1, Shulong Wang1

  • 1Key Laboratory for Wide-Band Gap Semiconductor Materials and Devices of Education, The School of Microlectronics, Xidian University, Xi'an 710071, China.

Micromachines
|October 23, 2021
PubMed

Keywords:
silicon-on-insulator (SOI)total ionizing dose (TID)tunneling field effect transistor (TFET)

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