Probing of coupling effect induced plasmonic charge accumulation for water oxidation

A key issue for redox reactions in plasmon-induced photocatalysis, particularly for water oxidation, is the concentration of surface-accumulating charges (electrons or holes) at a reaction site for artificial photosynthesis. However, where plasmonic charge accumulated at a catalyst's surface, and how to improve local charge density at active sites, remains unknown because it is difficult to identify the exact spatial location and local density of the plasmon-induced charge, particularly with regard to holes. Herein, we show that at the single particle level, plasmon-coupling-induced holes can be greatly accumulated at the plasmonic Au nanoparticle dimer/TiO₂ interface in the nanogap region, as directly evidenced by the locally enhanced surface photovoltage. Such an accumulation of plasmonic holes can significantly accelerate the water oxidation reaction (multi-holes involved) at the interfacial reaction site, with nearly one order of magnitude enhancement in photocatalytic activities compared to those of highly dispersed Au nanoparticles on TiO₂. Combining Kelvin probe force microscopy and theoretical simulation, we further clarified that the local accumulated hole density is proportional to the square of the local near-field enhancement. Our findings advance the understanding of how charges spatially distribute in plasmonic systems and the specific role that local charge density at reaction sites plays in plasmonic photocatalysis.