Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

6.1K
In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
6.1K
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

11.7K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
11.7K
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

2.6K
Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
2.6K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Reaction-Assisted Hierarchical Structuring for Enhanced Thermoelectric Performance in BiSbTe via In Situ Decomposition of GdCo<sub>2</sub> Precursors.

Inorganic chemistry·2026
Same author

Electron Recoil via Sample Momentum Transfer in Optical-Mode Excitation.

Physical review letters·2026
Same author

Mitofusins are required for specialized mitochondrial morphology and function of rod photoreceptor cells.

Frontiers in cell and developmental biology·2026
Same author

How Proton Incorporation Reshapes Lattice Dynamics In BaSnO<sub>3</sub>-Type Proton Conductors.

Advanced science (Weinheim, Baden-Wurttemberg, Germany)·2026
Same author

Research on Formulation Optimization and Storage Stability of <i>Pueraria lobata</i> Compound Beverage: Flavor Analysis and Shelf-Life Prediction.

Molecules (Basel, Switzerland)·2026
Same author

Rational Dual-Site Doping of the Hematite Photoanode Unlocks Efficient Solar Water Splitting.

ACS applied materials & interfaces·2026

Related Experiment Video

Updated: Oct 14, 2025

Resonance Raman Spectroscopy of Extreme Nanowires and Other 1D Systems
07:44

Resonance Raman Spectroscopy of Extreme Nanowires and Other 1D Systems

Published on: April 28, 2016

15.2K

High-endurance micro-engineered LaB6 nanowire electron source for high-resolution electron microscopy.

Han Zhang1, Yu Jimbo2, Akira Niwata2

  • 1Research Center for Advanced Material Characterization, National Institute for Materials Science, Tsukuba, Japan. ZHANG.han@nims.go.jp.

Nature Nanotechnology
|November 9, 2021
PubMed
Summary
This summary is machine-generated.

Researchers developed a new LaB6 nanowire electron source for high-resolution electron microscopy. This novel source offers atomic resolution and is a cost-effective alternative to traditional tungsten emitters.

More Related Videos

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
10:25

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Published on: September 14, 2018

10.3K
Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
08:10

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy

Published on: February 5, 2017

7.6K

Related Experiment Videos

Last Updated: Oct 14, 2025

Resonance Raman Spectroscopy of Extreme Nanowires and Other 1D Systems
07:44

Resonance Raman Spectroscopy of Extreme Nanowires and Other 1D Systems

Published on: April 28, 2016

15.2K
Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
10:25

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Published on: September 14, 2018

10.3K
Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
08:10

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy

Published on: February 5, 2017

7.6K

Area of Science:

  • Materials Science
  • Physics
  • Electron Microscopy

Background:

  • Nanostructures offer tunable properties for advanced electron sources.
  • Conventional tungsten (W) needle field emitters are currently the only sources achieving atomic resolution in electron microscopy.
  • Fabrication precision challenges have hindered the development of nanostructured electron sources.

Purpose of the Study:

  • To engineer a LaB6 nanowire-based electron source with high brightness and temporal coherence.
  • To overcome fabrication and alignment precision limitations in nanostructured electron sources.
  • To provide a viable, cost-effective alternative to conventional W-based electron sources.

Main Methods:

  • Micro-engineering of a LaB6 nanowire emitter integrated with a passive collimator.
  • Micromanipulation for precise alignment of the nanowire emission tip with the emitter axis.
  • Performance characterization in an aberration-corrected transmission electron microscope at 60 kV.

Main Results:

  • Achieved atomic resolution in both broad-beam and probe-forming modes.
  • Demonstrated a highly collimated electron beam with excellent lateral and angular alignment.
  • Reported electron energy loss spectroscopy resolution of 0.20 eV, 20% probe-forming efficiency, and low noise.

Conclusions:

  • The LaB6 nanowire electron source is a promising alternative to W-based sources for electron microscopy.
  • The developed source offers high performance with modest vacuum requirements.
  • This technology has the potential for use in low-cost electron beam instruments.