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Correlating Time Series Signals and Event Logs in Embedded Systems
Kazimierz Krosman1, Janusz Sosnowski1
1Institute of Computer Science, Warsaw University of Technology, 00-665 Warsaw, Poland.
This study presents a novel method for correlating device operational signals with internal events, even with clock inconsistencies. The approach accurately matches event logs to time series data, improving embedded system analysis.
Area of Science:
- Computer Science
- Embedded Systems Engineering
Background:
- Embedded systems generate diverse data, including time series signals and event logs.
- Correlating these data types is challenging due to potential clock drift between devices.
- Accurate correlation is crucial for understanding device performance and anomalies.
Purpose of the Study:
- To develop a robust method for correlating time series signals with event logs in embedded systems.
- To address the challenge of clock inconsistencies between data acquisition and monitored devices.
- To enable effective analysis of device operation and internal activities.
Main Methods:
- Classifying event logs using a novel similarity metric to determine their temporal distribution.
- Matching identified event log sequences with patterns in time series data.
- Employing iterative time offset adjustment for accurate correlation, utilizing object-oriented data models.
Main Results:
- The proposed algorithms successfully correlate event logs with time series signals, accounting for clock drift.
- The method was validated through power consumption analysis on a Holter device, demonstrating effectiveness.
- The approach proved universal and adaptable for various device optimization tasks.
Conclusions:
- The developed correlation technique provides a reliable solution for analyzing embedded system data.
- This method enhances the ability to diagnose device behavior and optimize performance.
- The universality of the approach suggests broad applicability across different embedded systems.
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