Visualisation of Amphetamine Contamination in Fingerprints Using TOF-SIMS Technique

Area of Science:

• Forensic Science
• Analytical Chemistry
• Mass Spectrometry

Background:

• Detecting illicit substances on fingerprints is crucial for forensic investigations.
• Traditional methods may have limitations in sensitivity and specificity for trace drug detection.

Purpose of the Study:

• To evaluate the efficacy of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for detecting amphetamine residues on latent fingerprints.
• To assess the impact of fingerprint lifting techniques and powders on TOF-SIMS analysis.

Main Methods:

• Latent fingerprints were developed using black powder and lifted with three different adhesive tapes.
• Samples were analyzed using TOF-SIMS to identify and map amphetamine distribution.
• The influence of fingerprint powder on the analysis was investigated.

Main Results:

• TOF-SIMS successfully detected amphetamine traces on lifted fingerprints.
• The technique visualized the spatial distribution of the drug on the fingerprint surface.
• Micro-contaminants on the fingerprint were also identified.
• Black latent fingerprint powder did not interfere with TOF-SIMS analysis.

Conclusions:

• TOF-SIMS is a viable technique for sensitive detection and mapping of amphetamine on fingerprints.
• The method allows for the analysis of drug distribution and co-contaminants.
• TOF-SIMS is compatible with standard fingerprint development powders, enhancing its forensic applicability.