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Updated: Oct 12, 2025

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Design, Fabrication, and Experimental Characterization of Plasmonic Photoconductive Terahertz Emitters
Published on: July 8, 2013
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Terahertz non-label subwavelength imaging with composite photonics-plasmonics structured illumination
Optics Express
|November 23, 2021
Summary
This study introduces a new terahertz imaging technique using spoof surface plasmons (SSPs) for subwavelength resolution. The method enhances imaging beyond traditional limits, enabling non-fluorescent sample analysis.
Area of Science:
- Optics and Photonics
- Materials Science
- Microscopy
Background:
- Structured Illumination Microscopy (SIM) offers subwavelength imaging but is limited to a two-fold resolution improvement.
- Traditional SIM methods are often restricted to fluorescent samples due to incoherent illumination sources.
Purpose of the Study:
- To develop a subwavelength imaging method for non-fluorescent samples in the terahertz (THz) range.
- To overcome the resolution limitations of conventional microscopy techniques.
Main Methods:
- Utilizing terahertz traveling waves and plasmonics, specifically spoof surface plasmons (SSPs) excited on a metal grating.
- Employing a modified post-processing algorithm to reconstruct high-order spatial frequency components encoded in scattered waves.
- Achieving subwavelength resolution by manipulating SSPs for illumination.
Main Results:
- Demonstrated a resolution enhancement up to 0.12λ₀ for non-fluorescent samples.
- Showcased the potential for further resolution improvement by using additional SSP illumination frequencies.
- Successfully encoded and reconstructed high-order spatial frequency components.
Conclusions:
- The proposed terahertz imaging method enables subwavelength resolution for non-fluorescent samples.
- This technique offers a promising approach for terahertz non-fluorescent microscopy and weak scattering sample detection.

