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Updated: Oct 12, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Semiconductor to topological insulator transition induced by stress propagation in metal dichalcogenide core-shell

Xi Dong1, Wei Lai, Pengpeng Zhang

  • 1Department of Physics and Astronomy, Michigan State University, East Lansing, MI 48824, USA. zhangpe@msu.edu.

Materials Horizons
|November 25, 2021
PubMed

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