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Area selective deposition using alternate deposition and etch super-cycle strategies
Marceline Bonvalot1,2, Christophe Vallée1,3, Cédric Mannequin2
1University Grenoble Alpes, CNRS, LTM, Grenoble INP, F-38054 Grenoble Cedex, France. marceline.bonvalot@cea.fr.
Dalton Transactions (Cambridge, England : 2003)
|December 8, 2021
Summary
Area selective deposition (ASD) using super-cycles requires careful optimization of the etching step. This approach enhances process throughput and limits contamination, enabling advanced material fabrication.
Area of Science:
- Materials Science
- Nanotechnology
- Chemical Engineering
Background:
- Area selective deposition (ASD) enables patterned thin film growth without photolithography.
- Defective selectivity in ASD necessitates correction, leading to the development of super-cycle strategies.
- Super-cycles involve alternating deposition and etching steps to maintain selectivity.
Purpose of the Study:
- To discuss and optimize the etching step in ASD super-cycles.
- To explore methods for improving ASD process throughput and reducing drift and contamination.
- To leverage complementary selective properties for enhanced ASD processes.
Main Methods:
- Detailed analysis of etching step parameters (chemistry, frequency, duration).
- Development of strategies for optimizing super-cycle ASD processes.
- Investigation of structure selective deposition as a complementary property.
Main Results:
- Optimization of the etching step is crucial for effective super-cycle ASD.
- Different approaches can enhance overall ASD process throughput.
- Process drift and contamination can be simultaneously limited.
- Structure selective deposition offers a valuable leverage for ASD super-cycles.
Conclusions:
- Careful optimization of the etching step is key to successful ASD by super-cycles.
- Super-cycle ASD offers a pathway to improved throughput and process control.
- Exploiting complementary selective properties enhances the versatility of ASD processes.
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