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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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Electron Microscope Tomography and Single-particle Reconstruction01:07

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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
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In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
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Imaging Secondary Electron Emission from a Single Atomic Layer.

Ondrej Dyck1, Jacob L Swett2, Andrew R Lupini1

  • 1Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA.

Small Methods
|December 20, 2021
PubMed
Summary
This summary is machine-generated.

Secondary-electron electron-beam-induced current (SE-EBIC) imaging can now characterize graphene layers, distinguishing between single and multiple layers. This technique also differentiates pristine from contaminated graphene, showing lower secondary electron yield for pristine samples.

Keywords:
graphenescanning transmission electron microscopysecondary electron e-beam induced currentsecondary electron yield

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Graphene's unique properties offer vast technological potential.
  • Characterizing atomically thin graphene structures and their electrical behavior presents significant challenges.
  • Secondary-electron electron-beam-induced current (SE-EBIC) imaging shows promise for high-resolution analysis of electrical conductivity.

Purpose of the Study:

  • To demonstrate the utility of SE-EBIC imaging for analyzing suspended graphene.
  • To differentiate between graphene layers and assess surface conditions using SE-EBIC.

Main Methods:

  • Utilized secondary-electron electron-beam-induced current (SE-EBIC) imaging.
  • Applied SE-EBIC to detect suspended single and few-layer graphene samples.
  • Compared secondary electron (SE) yield from pristine and contaminated graphene areas.

Main Results:

  • SE-EBIC imaging successfully detected suspended graphene layers.
  • The technique distinguished between different numbers of graphene layers.
  • Pristine graphene exhibited a significantly lower SE yield compared to contaminated regions.

Conclusions:

  • SE-EBIC imaging is a viable method for characterizing graphene layer number and surface contamination.
  • This imaging mode provides valuable insights for applications prioritizing secondary electron yield, such as surface coatings.