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Improved Intra-Pixel Sensitivity Characterization Based on Diffusion and Coupling Model for Infrared Focal Plane

Li Zhong1,2,3, Xiaoyan Li1,2,4, Min Zhu1,2,3

  • 1Key Laboratory of Intelligent Infrared Perception, Chinese Academy of Sciences, Shanghai 200083, China.

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A new Diffusion and Coupling Physical (DCP) model improves intra-pixel sensitivity (IPS) characterization for infrared focal plane arrays (FPAs). This method enhances accuracy in astronomical photometry, astrometry, and remote sensing applications.

Keywords:
diffusion and coupling modelinfrared focal plane array photodetectorintra-pixel sensitivity

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Area of Science:

  • Optoelectronics
  • Astrophysics instrumentation
  • Remote Sensing

Background:

  • High-precision characterization of intra-pixel sensitivity (IPS) is crucial for infrared focal plane arrays (FPAs) in astronomy and remote sensing.
  • Existing models like Discrete Sub-pixel Response (DSPR) and fill factor models are limited by their incomplete description of physical charge processes.
  • Inaccuracy in IPS characterization hinders high-precision photometry, astrometry, and target tracking.

Purpose of the Study:

  • To propose an improved IPS characterization method for infrared FPAs using a novel Diffusion and Coupling Physical (DCP) model.
  • To enhance the accuracy of IPS characterization by incorporating charge generation, collection, diffusion, and capacitance coupling.

Main Methods:

  • Developed the IPS model by convolving an ideal rectangular response with charge diffusion and capacitive coupling functions.
  • Created a beam spot scanning response model by convolving the IPS model with the beam spot profile.
  • Utilized the Trust-Region-Reflective algorithm to fit the beam spot scanning response map with the DCP model for parameter calculation.

Main Results:

  • Simulated results demonstrated a significant reduction in IPS characterization error (0.63% for DCP vs. 3.70% for DSPR) using a 3 μm beam spot.
  • Experimental results showed a lower fitting error for the beam spot scan response model (4.29% for DCP vs. 8.31% for DSPR).
  • The DCP model provides more accurate IPS characterization compared to existing methods.

Conclusions:

  • The proposed Diffusion and Coupling Physical (DCP) model offers a more accurate and physically grounded approach to characterizing intra-pixel sensitivity in infrared FPAs.
  • This improved characterization is vital for advancing high-precision astronomical observations and remote sensing applications.
  • The DCP model effectively accounts for charge diffusion and capacitance coupling, overcoming limitations of previous models.