A double crystal von Hamos spectrometer for traceable x-ray emission spectroscopy

Area of Science:

• Atomic Physics
• Spectroscopy
• Materials Science

Background:

• X-ray emission spectroscopy (XES) is crucial for analyzing atomic structure and chemical states.
• Existing spectrometers can be bulky and lack flexibility for varied experimental needs.

Purpose of the Study:

• To develop a novel, compact, and versatile double full-cylinder crystal X-ray spectrometer.
• To enable calibrated XES measurements for fundamental atomic parameter determination and chemical speciation.

Main Methods:

• Utilized a modified von Hamos geometry with double full-cylinder crystals.
• Employed highly annealed pyrolytic graphite (40 μm thick) bent to a 50 mm radius.
• Implemented a flexible design allowing for one or two crystal configurations.

Main Results:

• Realized a compact spectrometer with versatile crystal configurations (one for efficiency, two for resolution).
• Demonstrated applicability in the 2.4–18 keV photon energy range.
• Showcased utility in chemical speciation analysis, exemplified by battery electrode studies using resonant inelastic X-ray scattering.

Conclusions:

• The developed spectrometer provides a flexible and efficient platform for XES applications.
• It is suitable for both synchrotron radiation beamlines and laboratory-based setups.
• The instrument is well-suited for determining fundamental atomic parameters and evaluating chemical speciation.