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Updated: Oct 8, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Breakthrough instruments and products: DriveAFM for high-performance atomic force microscopy
Jonathan D Adams1, Patrick L T M Frederix1, Christian A Bippes1
1Nanosurf AG, Gräubernstrasse 12-14, 4410 Liestal, Switzerland.
Abstract:
Atomic force microscopy is a powerful technique for measurement and mapping of nanoscale topography and electrical and mechanical sample properties. The Nanosurf DriveAFM is a new generation instrument that combines ease of use and high performance through full motorization, CleanDrive photothermal excitation, and a mechanical and electrical design that allows for both high-resolution and large-range imaging.
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