Jove
Visualize
Contact Us

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.6K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.6K
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

13.7K
The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
13.7K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

High-Speed Quantitative Nanomechanical Mapping by Photothermal Off-Resonance Atomic Force Microscopy.

Small (Weinheim an der Bergstrasse, Germany)·2025
Same author

High-resolution mass measurements of single budding yeast reveal linear growth segments.

Nature communications·2022
Same author

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process.

Beilstein journal of nanotechnology·2019
Same author

Primary Product Branching in the Photodissociation of Chloroacetaldehyde at 157 nm.

The journal of physical chemistry. A·2017
Same author

Dissociative Photoionization of the Elusive Vinoxy Radical.

The journal of physical chemistry. A·2017
Same author

Direct-write nanoscale printing of nanogranular tunnelling strain sensors for sub-micrometre cantilevers.

Nature communications·2016
Same journal

Cluster assisted soft-landing hub (CLASH): An instrument for surface desorption and deposition using a pulsed cluster ion source.

The Review of scientific instruments·2026
Same journal

Influence of pre-ionization parameters on multi-channel discharge characteristics of field-distortion switch gaps.

The Review of scientific instruments·2026
Same journal

A Joule-Thomson low-temperature scanning tunneling microscope with vector magnet and rotatable scanning head.

The Review of scientific instruments·2026
Same journal

Fiber-optic triggering of a two-stage high-current linear transformer driver with laser energy below 100 μJ.

The Review of scientific instruments·2026
Same journal

Optimization of laboratory-scale x-ray absorption spectroscopy (XAS) apparatus for nuclear fuel research.

The Review of scientific instruments·2026
Same journal

Compressed multi-scale entropy and its application in mechanical fault diagnosis.

The Review of scientific instruments·2026
See all related articles
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: Oct 8, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
05:04

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

1.8K

Breakthrough instruments and products: DriveAFM for high-performance atomic force microscopy.

Jonathan D Adams1, Patrick L T M Frederix1, Christian A Bippes1

  • 1Nanosurf AG, Gräubernstrasse 12-14, 4410 Liestal, Switzerland.

The Review of Scientific Instruments
|January 1, 2022
PubMed
Summary
This summary is machine-generated.

Atomic force microscopy (AFM) offers detailed nanoscale imaging. The Nanosurf DriveAFM enhances this technique with full motorization and advanced excitation for high-resolution, large-range mapping.

More Related Videos

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

911
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

16.9K

Related Experiment Videos

Last Updated: Oct 8, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
05:04

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

1.8K
High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
08:59

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

911
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

16.9K

Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Atomic force microscopy (AFM) is crucial for analyzing nanoscale topography and material properties.
  • Existing AFM systems face limitations in ease of use and imaging range.

Purpose of the Study:

  • To introduce the Nanosurf DriveAFM, a next-generation AFM instrument.
  • To highlight its capabilities for high-resolution and large-range imaging.

Main Methods:

  • The Nanosurf DriveAFM features full motorization for automated operation.
  • It incorporates CleanDrive photothermal excitation for enhanced performance.
  • A robust mechanical and electrical design facilitates versatile imaging.

Main Results:

  • The instrument achieves high-resolution imaging of nanoscale features.
  • It enables large-range scanning without compromising image quality.
  • Ease of use is significantly improved through advanced automation.

Conclusions:

  • The Nanosurf DriveAFM represents a significant advancement in AFM technology.
  • It offers a powerful and user-friendly solution for nanoscale characterization.
  • The instrument is suitable for diverse applications requiring detailed surface analysis.