Ferromagnetism
MOS Capacitor
Mechanisms of Membrane Domain Formation
Electrostatic Boundary Conditions in Dielectrics
Membrane Domains
Non-ohmic Devices
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Oct 7, 2025

Optimized Setup and Protocol for Magnetic Domain Imaging with In Situ Hysteresis Measurement
Published on: November 7, 2017
Wenda Yang1, Guo Tian1, Hua Fan2
1Guangdong Provincial Key Laboratory of Quantum Engineering and Quantum Materials, Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China.
Researchers developed a stable, nonvolatile memory device using conductive ferroelectric domain walls in BiFeO3 films. This walltronics advancement offers high on/off ratios and excellent endurance for future electronics.
09:49In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
10:40A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: