Evaluation of DNA-mediated electron transfer using a hole-trapping nucleobase under crowded conditions

Yuuki Taketomi1, Yuuki Yamaguchi1, Shunsuke Sakurai1

  • 1Department of Engineering Science, Graduate School of Informatics and Engineering, The University of Electro-Communications, 1-5-1 Chofugaoka, Chofu, Tokyo 182-8585, Japan. makiko.tanaka@uec.ac.jp.

Related Concept Videos