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All-solid-state pulsed current injection source based on the light initiated multi-gate semiconductor switches.

Chongbiao Luan1, Hongwei Liu1, Xun Ma1

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This summary is machine-generated.

A new pulsed current injection source was developed to study transient electromagnetic pulse damage to electronic equipment cables. This device helps understand protection mechanisms against electromagnetic interference.

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Area of Science:

  • Electrical Engineering
  • Electromagnetics
  • Materials Science

Background:

  • Transient electromagnetic pulses (TEMPs) pose a significant risk to electronic equipment.
  • Understanding the damage and protection mechanisms of TEMPs on cables is crucial for electronic system reliability.

Purpose of the Study:

  • To develop a novel all-solid-state pulsed current injection source.
  • To investigate the damage and protection mechanisms of TEMPs on electronic equipment cables.

Main Methods:

  • Development of an all-solid-state pulsed current injection source utilizing light-initiated multi-gate semiconductor switches.
  • Characterization of the source's output, including peak current, risetime, and pulse width.

Main Results:

  • The developed source achieved an output peak current range of 0.1-1 kA.
  • The source exhibited a fast risetime of 18 ns and a pulse width of 520 ns.
  • Consistent output current waveforms were observed.

Conclusions:

  • The all-solid-state pulsed current injection source is a viable tool for studying TEMP effects.
  • The developed source enables detailed investigation into TEMP damage and protection strategies for electronic cables.