Neutron flat-panel detector using In-Ga-Zn-O thin-film transistor

Area of Science:

• Materials Science
• Physics
• Engineering

Background:

• Neutron imaging offers non-destructive internal structure analysis.
• Current neutron imaging detectors require enhancements in sensitivity, resolution, and radiation hardness.

Purpose of the Study:

• To develop and evaluate a novel neutron flat-panel detector (nFPD).
• To demonstrate the capabilities of the IGZO-based nFPD for neutron imaging and computed tomography.

Main Methods:

• Development of an nFPD utilizing an Indium Gallium Zinc Oxide (IGZO) thin-film transistor (TFT)/photodiode array.
• Direct photo-coupling of the IGZO array to a LiF/ZnS scintillator sheet.
• Performance evaluation and neutron imaging experiments, including 3D computed tomography.

Main Results:

• The IGZO nFPD demonstrates efficient light collection due to direct photo-coupling.
• Low leakage current from IGZO TFTs allows for longer exposure times, beneficial for low-flux neutron sources.
• Successful neutron imaging and 3D computed tomography were achieved with the developed detector.

Conclusions:

• The developed IGZO nFPD is a compact and easily handled neutron imaging detector.
• The detector's characteristics, including low leakage current and efficient light collection, show promise for advancing neutron imaging technologies.
• The nFPD is suitable for various neutron imaging applications, especially at compact neutron sources.