Updated: Oct 4, 2025

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
Published on: August 28, 2018
Hongyu Tian1, Chongdan Ren2, Sake Wang3,4
1School of Physics and Electronic Engineering, Linyi University, Linyi 276005, People's Republic of China.
Electrostatic Boundary Conditions in Dielectrics
Biasing of Metal-Semiconductor Junctions
Boundary Conditions: Lossless Lines
Metal-Semiconductor Junctions
Electric Field of Parallel Conducting Plates
Electric Field at the Surface of a Conductor
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