Absolute SESAM characterization via polarization-resolved non-collinear equivalent time sampling

Semiconductor saturable absorber mirrors (SESAMs) have enabled a wide variety of modelocked laser systems, which makes measuring their nonlinear properties an important step in laser design. Here, we demonstrate complete characterization of SESAMs using an equivalent time sampling apparatus. The light source is a free-running dual-comb laser, which produces a pair of sub-150-fs modelocked laser outputs at 1051 nm from a single cavity. The average pulse repetition rate is 80.1 MHz, and the full time window is scanned at 240 Hz. Cross-correlation between the beams is used to calibrate the time axis of the measurements, and we use a non-collinear pump-probe geometry on the sample. The measurements enable fast and robust determination of all the nonlinear reflectivity and recovery time parameters of the devices from a single setup, and show good agreement with conventional nonlinear reflectivity measurements. We compare measurements to a rate equation model, showing good agreement up to high pulse fluence values and revealing that the samples tested exhibit a slightly slower recovery at higher fluence values. Lastly, we examine the polarization dependence of the reflectivity, revealing a reduced rollover if cross-polarized beams are used or if the sample is oriented optimally around the beam axis.