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Properties of frozen sections relevant to quantitative microanalysis
Journal of Microscopy
|March 1, 1986
Summary
Quantitative X-ray microanalysis of frozen sections is challenging due to ice-crystal and electron-beam damage. Peak-to-continuum ratios remain reliable for elemental analysis, especially with cold-stage techniques minimizing mass loss.
Area of Science:
- Materials Science
- Analytical Chemistry
- Microscopy
Background:
- Quantitative X-ray microanalysis of frozen sections faces challenges from ice-crystal and electron-beam damage.
- The reliability of X-ray peak-to-continuum ratios for elemental concentration is debated, particularly concerning ice-crystal scale in dehydrated samples.
Purpose of the Study:
- To re-interpret existing experimental data on X-ray peak-to-continuum ratios in frozen sections.
- To evaluate the impact of ice-crystal scale and electron-beam induced mass loss on quantitative analysis.
- To assess the effectiveness of cold-stage microscopy in mitigating these issues.
Main Methods:
- Re-analysis of experimental data concerning X-ray peak-to-continuum ratios.
- Investigation of electron-beam induced mass loss at varying temperatures (300 K vs. 100 K).
- Assessment of quantitative analysis feasibility at different spatial resolutions (1 micron vs. 100 nm).
Main Results:
- X-ray peak intensities may be affected by ice-crystal scale, but peak-to-continuum ratios are robust after continuum corrections.
- Electron-beam induced mass loss significantly impacts accuracy, but can be substantially reduced using a cold-stage (e.g., at 100 K).
- Quantitative analysis of frozen-hydrated sections at 1-micron resolution is feasible at 100 K, but high-resolution (100 nm) analysis is precluded by mass loss.
Conclusions:
- The peak-to-continuum method remains a viable quantitative technique for elemental analysis in frozen sections, provided continuum corrections are applied.
- Cold-stage microscopy is crucial for minimizing electron-beam induced mass loss, enabling more accurate analysis at moderate resolutions.
- Achieving quantitative X-ray analysis at very high resolutions (sub-100 nm) still presents significant challenges, even with mass measurement techniques.