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Updated: Oct 2, 2025

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Fourier ptychographic dark field x-ray microscopy

Mads Carlsen, Trygve M Ræder, Can Yildirim

    Optics Express
    |February 25, 2022
    PubMed
    Summary

    A new coherent Fourier ptychographic method enhances dark-field x-ray microscopy (DFXM) for detailed 3D lattice strain mapping in crystalline materials. This technique improves structural distortion analysis with minimal instrumentation changes.

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