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Related Concept Videos

Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
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The hard x-ray nanotomography microscope at the advanced light source.

Joseph B Nichols1, Marco Voltolini2, Benjamin Gilbert2

  • 1Advanced Light Source, Lawrence Berkeley National Lab, Berkeley, California 94720, USA.

The Review of Scientific Instruments
|March 2, 2022
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Summary

A new nanoscale transmission x-ray microscope at the Advanced Light Source offers high-resolution imaging of composite and porous materials. This advanced instrument enables detailed 3D structural analysis for materials science and geology applications.

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Area of Science:

  • Materials Science
  • X-ray Microscopy
  • Nanotechnology

Background:

  • Advanced Light Source (ALS) Beamline 11.3.1 is a tender/hard x-ray facility.
  • Materials' performance and geologic behavior are dictated by submicrometer structure and compositional heterogeneity.
  • Existing imaging techniques may lack the resolution to fully characterize complex material microstructures.

Purpose of the Study:

  • To introduce a newly re-purposed nanoscale transmission x-ray microscope (nTXM) at ALS Beamline 11.3.1.
  • To detail the instrument's design, capabilities, and resolution for imaging heterogeneous materials.
  • To present initial results from 3D imaging of composite and geomaterials.

Main Methods:

  • Utilized a full-field transmission x-ray microscope with theoretical and achieved resolutions of 55 nm and <100 nm, respectively.
  • Employed nanoscale computed tomography with a <25 nm eccentricity rotation stage for high-resolution volume imaging.
  • Incorporated a novel bipolar illumination condenser, a phase-type zone plate objective, and an indirect x-ray detection system with a CMOS detector.

Main Results:

  • Demonstrated the capability to image the internal three-dimensional microstructure and nanostructure of materials.
  • Achieved high-resolution imaging of complex materials, including fiber-reinforced composites and geomaterials.
  • Validated the instrument's performance for detailed materials characterization.

Conclusions:

  • The new nTXM at ALS Beamline 11.3.1 is a powerful tool for submicrometer and nanoscale imaging of materials.
  • The instrument facilitates advanced 3D structural analysis critical for understanding material properties and behavior.
  • Early results showcase the system's potential for significant contributions to materials science and geology research.