Application-Adaptable Chipless RFID Tag: Design Methodology, Metrics, and Measurements

Katelyn R Brinker1, Marshall Vaccaro1, Reza Zoughi1

  • 1Applied Microwave Nondestructive Testing Laboratory at the Missouri University of Science and Technology, Rolla, MO 65401 USA.

IEEE Transactions on Instrumentation and Measurement
|March 3, 2022
PubMed

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