Measurement of Inkjet-Printing Parameters for Accurate Chipless RFID Tag EM Simulation

Katelyn Brinker1, Reza Zoughi1

  • 1Applied Microwave Nondestructive Testing Laboratory (amntl), Missouri University of Science and Technology, Rolla, MO 65409, USA.

... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference
|March 3, 2022
PubMed

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