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Related Concept Videos

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Very-High Dynamic Range, 10,000 Frames/Second Pixel Array Detector for Electron Microscopy.

Hugh T Philipp1, Mark W Tate1, Katherine S Shanks1,2

  • 1Laboratory of Atomic and Solid-State Physics (LASSP), Cornell University, Ithaca, NY, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|March 7, 2022
PubMed
Summary
This summary is machine-generated.

The new Electron Microscope Pixel Array Detector (EMPAD-G2) enables faster, more accurate quantitative scanning transmission electron microscopy (STEM) by handling high beam currents and wide dynamic ranges. This advanced detector improves imaging speed and data quality for mapping material properties.

Keywords:
STEMdirect detectorselectron microscope pixel array detector (EMPAD)imaging detectorsptychography

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Area of Science:

  • Materials Science
  • Electron Microscopy
  • Physics

Background:

  • Quantitative scanning transmission electron microscopy (STEM) methods like ptychography require precise dose control for accurate mapping of electric, magnetic, and strain fields.
  • High beam currents and sensitive signal detection are crucial for efficient data acquisition in STEM.
  • Existing detectors face limitations in dynamic range and speed, impacting the quality and timeliness of STEM data.

Purpose of the Study:

  • To introduce and evaluate the second-generation Electron Microscope Pixel Array Detector (EMPAD-G2) for advanced STEM applications.
  • To demonstrate the EMPAD-G2's capability to overcome limitations of previous detectors in terms of speed, dynamic range, and data quality.
  • To present a new metric, maximum usable imaging speed (MUIS), for characterizing detector performance.

Main Methods:

  • Development and implementation of the EMPAD-G2, a hybrid pixel array detector with advanced capabilities.
  • Continuous imaging at frame rates up to 10 kHz with a wide dynamic range (single electrons to >180 pA/pixel).
  • Testing across electron energies from 80 to 300 keV, including ptychographic reconstructions and strain/polarization mapping.

Main Results:

  • The EMPAD-G2 achieves high-speed imaging (up to 10 kHz) with exceptional dynamic range at 300 keV.
  • It enables simultaneous collection of comprehensive diffraction information, from bright-field disks to Kikuchi bands.
  • Experimental results showcase successful ptychographic reconstructions and accurate mapping of strain and polarization fields.

Conclusions:

  • The EMPAD-G2 significantly advances quantitative STEM by enabling rapid, high-quality data acquisition.
  • Its performance characteristics allow for precise mapping of material properties, even with challenging beam conditions.
  • The introduction of MUIS provides a standardized method for assessing detector performance in electron-starved or saturated regimes.