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A polycrystalline diamond micro-detector for X-ray absorption fine-structure measurements
Lei Yao1, Yunpeng Liu1, Bingjie Wang1
1Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, People's Republic of China.
Journal of Synchrotron Radiation
|March 7, 2022
Summary
This study details a new chemical-vapor-deposited polycrystalline diamond micro-detector for X-ray intensity measurements. This novel detector demonstrates superior performance in X-ray absorption fine-structure spectroscopy compared to traditional ion chambers.
Area of Science:
- Materials Science
- Physics
- Analytical Chemistry
Background:
- Microminiaturization of X-ray detectors is crucial for advanced experimental techniques.
- Chemical-vapor-deposited (CVD) polycrystalline diamond offers advantageous properties like thermal stability and conductivity for detector fabrication.
Purpose of the Study:
- To fabricate and characterize a micro-detector using CVD polycrystalline diamond film.
- To evaluate the performance of the CVD diamond micro-detector in X-ray absorption fine-structure (XAFS) spectroscopy.
Main Methods:
- Fabrication of a micro-detector using CVD polycrystalline diamond.
- Performance testing using K-edge XAFS spectra of Cr, Fe, Cu, and Se foils.
- Comparison with a routine ion chamber at the Beijing Synchrotron Radiation Facility.
Main Results:
- The CVD diamond micro-detector was successfully fabricated with dimensions of 15mm × 7.8mm × 5.8mm.
- The detector exhibited excellent performance in recording XAFS spectra, outperforming a standard ion chamber.
- Feasibility demonstrated for X-ray intensity recording in XAFS measurements.
Conclusions:
- CVD polycrystalline diamond is a suitable material for fabricating high-performance micro-detectors.
- The developed CVD diamond micro-detector is a viable alternative for XAFS measurements.
- This technology advances combined X-ray experimental techniques through enhanced detector capabilities.
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