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Updated: Jan 24, 2026

An All-in-one Sample Holder for Macromolecular X-ray Crystallography with Minimal Background Scattering
Published on: July 6, 2019
Fully automated measurement system for temperature-dependent X-ray total scattering at beamline BL04B2 at SPring-8
Hiroki Yamada1, Kengo Nakada1, Michitaka Takemoto1
1Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.
Abstract:
Data-driven approaches in materials science demand the collection of large amounts of data on the target materials at synchrotron beamlines. To accurately gather suitable experimental data, it is essential to establish fully automated measurement systems to reduce the workload of the beamline staff. Moreover, the recent COVID-19 pandemic has further emphasized the necessity of automated and/or remote measurements at synchrotron beamlines. Here, the installation of a new sample changer combined with a high-temperature furnace and a fully automated alignment system on beamline BL04B2 at SPring-8 is reported. The system allows X-ray total scattering measurements of up to 21 samples at different temperatures (from room temperature to 1200°C) to be conducted without any human assistance.
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