Related Experiment Video
Updated: Sep 30, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Microspheres give improved resolution in nondestructive examination of semiconductor devices
1College of Engineering, University of South Alabama, Mobile, AL, USA. clivewoods@southalabama.edu.
Abstract:
The minimum spatial resolution of typical optical inspection systems used in the microelectronics industry is generally governed by the classical relations of Ernst Abbe. Kwon et al. show in a new Light: Science and Applications article that using an additional glass microsphere in the optical path can improve the resolution significantly.
More Related Videos
Related Concept Videos
Overview of Electron Microscopy
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Overview of Microscopy Techniques
Super-resolution Fluorescence Microscopy
Preparation of Samples for Electron Microscopy

