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Updated: Sep 29, 2025

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
Published on: April 29, 2020
Machine learning for impurity charge-state transition levels in semiconductors from elemental properties using
Maciej P Polak1, Ryan Jacobs1, Arun Mannodi-Kanakkithodi2
1Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706-1595, USA.
Machine learning rapidly predicts semiconductor impurity transition levels using multi-fidelity data. This approach significantly cuts computational costs and time, enabling faster material discovery for optoelectronic devices.
Area of Science:
- Materials Science
- Computational Physics
- Semiconductor Physics
Background:
- Accurate quantification of impurity charge-state transition energy levels is crucial for semiconductor optoelectronics.
- Current measurement and calculation methods are time-consuming, necessitating faster prediction techniques.
Purpose of the Study:
- To develop a rapid machine learning (ML) model for predicting impurity transition levels in semiconductors.
- To reduce the computational cost and time associated with predicting these critical energy levels.
Main Methods:
- Utilized a multi-fidelity dataset combining low-fidelity (LDA/GGA) and high-fidelity (HSE06) Density Functional Theory (DFT) calculations.
- Employed an ML approach with features based on elemental properties and impurity positions.
- Applied a modified band alignment scheme to correct low-fidelity DFT results.
Main Results:
- Achieved a root mean squared error of 0.36 eV (mean absolute error of 0.27 eV) against high-fidelity DFT values for II-VI and III-V semiconductors.
- Demonstrated improved accuracy with multi-fidelity data compared to models trained solely on high-fidelity data.
- Successfully predicted transition levels across all zinc blende III-V and II-VI systems.
Conclusions:
- The developed ML model offers a computationally efficient and accurate method for predicting impurity transition levels.
- This approach accelerates the discovery and engineering of semiconductor materials for advanced optoelectronic applications.
- The model provides a valuable tool for guiding future research in semiconductor materials design.
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