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Updated: Sep 29, 2025

Lensless Fluorescent Microscopy on a Chip
Published on: August 17, 2011
Mengyu Jia1, Lequan Yu2, Wenxing Bai1
1College of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin, China.
This study introduces a deep learning framework for single-pixel imaging (SPI) that overcomes sub-Nyquist sampling challenges. The unsupervised method achieves high image fidelity at low sampling rates, enhancing compressive imaging applications.
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