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Updated: Sep 29, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Xiao Zhou1, Cong Zhou1, Tingting Zhang1
1School of Mechanical and Electronic Engineering, Wuhan University of Technology, Wuhan 430070, China.
This study introduces a multi-camera system for precise dimension measurement of thin workpieces. The novel method achieves high accuracy and a large field of view in a single exposure without mechanical motion.
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